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Elemental Analysis: Optical Emission Spectrometers; In-Line XRF Analyzers; Handheld XRF Spectrometers; X-Ray Coating Analysis; TXRF Spectrometers; Micro-XRF Spectrometers; EPR Instruments; Itrax Core Scanner; Information Management Systems

Surface Analysis: Stylus Profilometers; 3D Optical Microscopes; Nanomechanical Test Instruments; Tribometers and Mechanical Testers; Atomic Force Microscopes

Solar Energy Detection/Semiconductor: Film Stress; Film Adhesion

General Equipment: DANTE DPP (digital pulse processor); Charge Sensitive Preamplifier CUBE; PV/I-V Test; Coating Thickness Gauges; AFM Probes

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Film Stress

FSM128 Film Stress & Wafer Bow
FSM pioneered and commercialized the laser scanning optical lever (Optilever) t.....
FSM 500 Film Stress & Wafer Bow
The FSM 500TC 200mm features a patented auto dual laser technology.
Line Card
Metrology Tools forSemiconductor, LED, Solar, FPD, MEMS, Data Storage
128 Series
The FSM 128 can accommodate 50mm to 200 mm wafers without the need to change sam.....

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