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Elemental Analysis: Optical Emission Spectrometers; In-Line XRF Analyzers; Handheld XRF Spectrometers; X-Ray Coating Analysis; TXRF Spectrometers; Micro-XRF Spectrometers; EPR Instruments; Itrax Core Scanner; Information Management Systems

Surface Analysis: Stylus Profilometers; 3D Optical Microscopes; Nanomechanical Test Instruments; Tribometers and Mechanical Testers; Atomic Force Microscopes

Solar Energy Detection/Semiconductor: Film Stress; Film Adhesion

General Equipment: DANTE DPP (digital pulse processor); Charge Sensitive Preamplifier CUBE; PV/I-V Test; Coating Thickness Gauges; AFM Probes

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Product Center

3D Optical Microscopes

ContourGT-X
Automated, gauge-capable metrology for R&D and production
ContourGT-I
World’s first automated benchtop profiler with tip/tilt in the head
NPFLEX
Large-Sample, Non-Contact Measurement & Analysis
ContourX-200
The ContourX-200 Optical Profilometer provides the perfect blend of advanced cha.....

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